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IEA/AIE 2017 Conference

Anne-Mette Christensen 26 June, 2017

On June 27-30 Nicolaj from HUGIN is going to attend the IEA/AIE 2017 [http://www.cril.univ-artois.fr/ieaaie2017/]Conference in Arras, France.

Nicolaj will present the paper “Applying Object-Oriented Bayesian Networks for Smart Diagnosis and Health Monitoring at both Component and Factory Level” that he has co-authored. The paper is a part of the SelSus project [selsus.hugin.com] and it presents a framework based on Object-Oriented Bayesian Networks for health monitoring and diagnosing break downs in manufacturing systems. As an example the system is integrated into the control software of a welding controller produced by Harms & Wende [https://www.harms-wende.de/], and a prototype dashboard for diagnosing errors on the device has been implemented (See Screenshot below).

Improperly connected Device

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